From 57f0f512b273f60d52568b8c6b77e17f5636edc0 Mon Sep 17 00:00:00 2001 From: André Fabian Silva Delgado Date: Wed, 5 Aug 2015 17:04:01 -0300 Subject: Initial import --- arch/sparc/include/asm/estate.h | 49 +++++++++++++++++++++++++++++++++++++++++ 1 file changed, 49 insertions(+) create mode 100644 arch/sparc/include/asm/estate.h (limited to 'arch/sparc/include/asm/estate.h') diff --git a/arch/sparc/include/asm/estate.h b/arch/sparc/include/asm/estate.h new file mode 100644 index 000000000..520c08560 --- /dev/null +++ b/arch/sparc/include/asm/estate.h @@ -0,0 +1,49 @@ +#ifndef _SPARC64_ESTATE_H +#define _SPARC64_ESTATE_H + +/* UltraSPARC-III E-cache Error Enable */ +#define ESTATE_ERROR_FMT 0x0000000000040000 /* Force MTAG ECC */ +#define ESTATE_ERROR_FMESS 0x000000000003c000 /* Forced MTAG ECC val */ +#define ESTATE_ERROR_FMD 0x0000000000002000 /* Force DATA ECC */ +#define ESTATE_ERROR_FDECC 0x0000000000001ff0 /* Forced DATA ECC val */ +#define ESTATE_ERROR_UCEEN 0x0000000000000008 /* See below */ +#define ESTATE_ERROR_NCEEN 0x0000000000000002 /* See below */ +#define ESTATE_ERROR_CEEN 0x0000000000000001 /* See below */ + +/* UCEEN enables the fast_ECC_error trap for: 1) software correctable E-cache + * errors 2) uncorrectable E-cache errors. Such events only occur on reads + * of the E-cache by the local processor for: 1) data loads 2) instruction + * fetches 3) atomic operations. Such events _cannot_ occur for: 1) merge + * 2) writeback 2) copyout. The AFSR bits associated with these traps are + * UCC and UCU. + */ + +/* NCEEN enables instruction_access_error, data_access_error, and ECC_error traps + * for uncorrectable ECC errors and system errors. + * + * Uncorrectable system bus data error or MTAG ECC error, system bus TimeOUT, + * or system bus BusERR: + * 1) As the result of an instruction fetch, will generate instruction_access_error + * 2) As the result of a load etc. will generate data_access_error. + * 3) As the result of store merge completion, writeback, or copyout will + * generate a disrupting ECC_error trap. + * 4) As the result of such errors on instruction vector fetch can generate any + * of the 3 trap types. + * + * The AFSR bits associated with these traps are EMU, EDU, WDU, CPU, IVU, UE, + * BERR, and TO. + */ + +/* CEEN enables the ECC_error trap for hardware corrected ECC errors. System bus + * reads resulting in a hardware corrected data or MTAG ECC error will generate an + * ECC_error disrupting trap with this bit enabled. + * + * This same trap will also be generated when a hardware corrected ECC error results + * during store merge, writeback, and copyout operations. + */ + +/* In general, if the trap enable bits above are disabled the AFSR bits will still + * log the events even though the trap will not be generated by the processor. + */ + +#endif /* _SPARC64_ESTATE_H */ -- cgit v1.2.3-54-g00ecf